PANalytical X’Pert 1

PANalytical X'Pert 2

Laue

ANalytical X’Pert 1 and 2 are multipurpose diffractometers that can be used for high-resolution as well as for lower resolution measurements.

The diffractometer usually consists of the following basic parts:

X-ray source

Incident beam conditioner

Sample stage

Diffracted beam conditioner + detector

In order to obtain specific structural information from the material by using x-ray diffraction we need to combine the above-mentioned parts into an arrangement that would balance resolution, intensity and data collection time.

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The XRD techniques here are divided into:

High-resolution

Mostly used for near-perfect epitaxial thin films and single crystals.

PANalytical X’Pert 1 high-resolution mode can also be used for textured epitaxial thin films.

Medium resolution

Primarily used for thin films that are textured epitaxial, textured polycrystalline.

Also can be used for polycrystalline and amorphous materials.

Low resolution

Mostly used for polycrystalline as well as amorphous materials.

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Laue diffractometer is mostly used for alignment of single crystals. The diffractometer can also be used for indexing.