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X'Pert1is the PANalytical X'Pert PRO x-ray diffraction system used for a wide variety of applications in analytical x-ray diffraction.
The following applications are possible with X'Pert diffractometer:
High resolution rocking curve analysis, reciprocal space mapping and x-ray topography on (epitaxial) layers on single crystal substrates
Reflectometry on thin layers and substrate materials
Phase analysis of samples with flat or irregular surfaces of thin films and of samples in glass capillaries
All applications can be performed in room temperature as well as at high temperatures (up to 900oC) using Anton-Paar hot stage
The modular design of X'Pert PRO utilizes the PreFIX concept that makes possible to perform more than one analysis on one system. PreFIX stands for: Pre-aligned Fast Interchangeable X-ray modules.
PreFIX
modules and accessories are factory aligned so they can be dismounted
from the system and then mounted again without the need for system
alignment by the user. PreFIX enables to reconfigure the system from
one application setup to another within a few minutes without the
need for additional system alignment.